XRF Lab
Contact: Tyrone O. Rooney
Department of Earth and Environmental Sciences
288 Farm Lane, Room 207
East Lansing, MI 48824-1115
Phone: (517) 432-5522
Fax: (517) 353-8787
Sample Preparation
Analytical Fees
The XRF laboratory at Michigan State University installed a Bruker S4 PIONEER – a 4 kW wavelength dispersive X-ray fluorescence spectrometer (WDXRF). It is dedicated primarily to serve the geosciences, but can be used for diverse applications (forensic science, archeology, industrial compounds, etc.). The S4 PIONEER with advanced 4 kW tube provides highest sensitivity especially for light elements and trace elements due to optimized beam geometry and very thin Beryllium XRF tube window used in combination with software optimized excitation parameters for each element analyzed.
Data reduction is performed with Bruker's SPECTRAplus software using fundamental parameters.
Sample Preparation
Fused Disks
The dissolution of a portion of the sample by a flux and fusion into a homogeneous
glass entirely eliminates particle size and mineralogical effects. The fusion technique
also has additional advantages:
• high specimen dilution for the purpose of decreasing matrix effects
• ease of preparing standards of desired composition
The fusion procedure consists of heating a mixture of 4 grams of sample and 9 grams
of lithium tetraborate flux at high temperatures (800 to 1200°C) so that the flux
melts and the sample dissolves. The overall composition and cooling conditions is
such that the end product after cooling is a one-phase glass.
Heating of the sample-flux mixture is done in platinum alloy crucibles, and then poured
into a Pt mold.
Variable | N | Mean | Median | StDev | SE** | Given* |
---|---|---|---|---|---|---|
SiO2 |
5 |
52.054 |
52.16 |
0.273 |
0.122 |
52.41 |
TiO2 |
5 |
1.282 |
1.28 |
0.0045 |
0.002 |
1.32 |
Al2O3 |
5 |
14.504 |
14.5 |
0.036 |
0.016 |
14.53 |
Fe2O3 |
5 |
8.998 |
9 |
0.0045 |
0.002 |
9.05 |
MnO |
5 |
0.14 |
0.14 |
0 |
0 |
0.15 |
MgO |
5 |
7.824 |
7.81 |
0.0688 |
0.0308 |
7.83 |
CaO |
5 |
9.288 |
9.29 |
0.0084 |
0.0037 |
9.31 |
Na2O |
5 |
2.714 |
2.71 |
0.023 |
0.0103 |
2.73 |
K2O |
5 |
1.382 |
1.38 |
0.0045 |
0.002 |
1.4 |
P2O5 |
5 |
0.268 |
0.27 |
0.00447 |
0.002 |
0.26 |
totals |
5 |
98.454 |
98.49 |
0.171 |
0.076 |
98.99 |
*Accepted values for JB-1a standard reference material, Nimai et al. (1995) Geostandards Newsletter, 19, 135-213
** Standard error = standard deviation divided by the square root of the number of samples
Analytical Fees
The joint X-ray Fluorescence and ICP-MS Laboratories at MSU offer a variety of analytical services, including elemental packages for rock and soil samples (Option 1 below).
The following schedule shows estimated fees. Additional discounts may be given for large numbers of samples or in-house sample preparation. Fees are subject to change at any time. Prices reflect a normal turn-around time of about one (1) month. Rush orders may require additional charges. Please consult Tyrone Rooney before officially quoting any prices.
Geological (rock and soil) Samples
Sample Preparation: All samples are analyzed as glass disks, prepared by fusion of finely-ground rock powders with lithium tetraborate. Samples may be submitted as powders or in bulk. Submit a minimum of 8 grams powder or 30 grams whole rock. Sample preparation fees for any type of elemental analysis are as follows:
Type of sample | Cost per sample |
---|---|
Trimming/powdering of bulk samples |
$5 |
Li2B4O7 fusion (of powdered samples*) |
$6.50 |
*Submitted sample powders should be fine enough so they are not “gritty” when rubbed between sheets of paper. Re-powdering of gritty samples will require an additional charge.
Element Detection | Academic Research |
Commercial |
---|---|---|
Major elements (XRF) |
$40 |
$80 |
Major elements + 31 trace elements (XRF + LA-ICP-MS)* |
$100 |
$200 |
*A minimum charge of $600.00 will apply for all geological analyses involving LA-ICP-MS. This cost reflects the minimum time to tune the instrument, run standards, and data processing. Please consult our ICP-MS laboratory webpage for further information.